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HDD/SSD compact burn-in Test System
This system is a tester for evaluating the temperature environment of storage media in combination with our SMART TESTER series.
Our compact burn-in test system can be used with AC100V power supply.
Please feel free to consult us in the case that you would like to conduct the low temperature test.
<Support SSD type>
| Add-in Card | M.2 | U.2 | EDSFF |
<Support Interfaces>
- PCIe Gen4
- PCIe Gen3
- SATA III
- SAS II(Option)
<Support Protocols>
- NVMe 1.4
- NVMe 1.3
- AHCI
Application
SSD Product Evaluation
SSD Reliability Evaluation
Features
The system enables to test 4 pcs of SSD at the same time.
This compact size system enables to conduct the burn-in test on the desk top.
The choice of an applicable drive unit enables to conduct the test of the add-in type, M.2, U.2 and EDSFF respectively.
A wide range of temperature test is possible.(room temperature～+85℃）
Applicable Drive Interfaces are PCIe Gen4, PCIe Gen3, SATA, SAS.
The Power Supply for a Drive is available in 2 types : (3.3V and 12V for PCIe Gen4/Gen3), 5V and 12V for SATA/SAS)
The independent control and the voltage / current measurements per the port in which a drive has been set are possible.
The system enables to conduct the test in which the temperature control synchronizes the interface test.
The LED mounted at the port can indicate the test status and the result.
The system supports the measurement of micro current in the SSD’s low power consumption mode (L1.2).
(Measurement accuracy: ±5%rdg.±10dgt. at 100μA～1mA)
It is possible to customize the number of ports, the temperature range, etc. upon customer’s request.
Model
| Burn-in Unit Details | Structure | Specifications |
|---|---|---|
| Unit Details of the Applicable System | Structure | Specifications |
| Example of Actual Usage of the Applicable System | Example of Actual Usage | |
System for PCIe Gen3
| Burn-in Unit Details | Structure | Specifications |
|---|---|---|
| Unit Details of the Applicable System | Structure | Specifications |
System for SATA/SAS
| Burn-in Unit Details | Structure | Specifications |
|---|---|---|
| Unit Details of the Applicable System | Structure | Specifications |
Configurations
The structures of each interface are shown as follows.
Burn-in Unit ※Common for every interface.
Compact Burn-in Chamber
System for PCIe Gen4
・Control Unit SMART TESTER for PCIe G4
| ・Drive Unit Please choose the one from the followings which meets your desirable type to be tested. | ||
| Types to be tested | Add-in Card / M.2 / U.2 | EDSFF |
|---|---|---|
| Unit Name | M.2-G4 Drive |
EDSFF-G4 Drive |
System for PCIe Gen3
・Control Unit SMART TESTER for PCIe G3
| ・Drive Unit Please choose the one from the followings which meets your desirable type to be tested. | |||
| Types to be tested | M.2 | Add-in Card / M.2 / U.2 | EDSFF |
|---|---|---|---|
| Unit Name | M.2-G3 Drive |
Multi-Drive |
EDSFF-G3 Drive |
System for SATA/SAS
・Control Unit SMART TESTER for 6G
| ・Drive Unit | |
| Types to be tested | SSD 2.5inch type / M.2 |
|---|---|
| Unit Name | SATA/SAS Drive |
Introduction example
Example of Actual Usage of the Unit in the case that a Burn-in Test of M.2 SSD for PCIe Gen4 is conducted.
Specifications
| Burn-in Unit | |
| Name | Compact Burn-in Chamber |
|---|---|
| Power Supply | AC100V |
| Maximum Current | 5A |
| Outside Dimensions WxDxH[mm] | 470x710x650 |
| Inside Dimensions of Chamber WxDxH[mm] | 410x530x370 |
| Weight | 10kg |
| Environmental Temperature | +15℃～+30℃ |
| Temperature Control Range | Room Temperature ～+85℃ |
| Space Temperature Deviation | ±2℃ |
| Temperature Rise Velocity | 1℃/3minutes |
※Specification may be changeable without a prior notice.
| System for PCIe Gen4 | ||
| Control Unit & Drive Unit | ||
| Number of Mountable Drives under Test | 4 pcs at maximum | |
|---|---|---|
| Applicable Interface | Gen2 / Gen3 / Gen4 | |
| Number of Lane | 4 lanes at maximum | |
| Supported Protocols | NVMe 1.4 / NVMe 1.3 / AHCI | |
| Supply Voltage to Drives | 12.0V Series Output Voltage:8.0V～14.5V 20mV Step Variable Voltage Accuracy: Preset Voltage±100mV Load Current：3.5Amax 3.3V Series Output Voltage:2.0V～ 4.0V 10mV Step Variable Voltage Accuracy: Preset Voltage± 50mV Load Current:4.2Amax |
|
| Drive Power Supply Voltage Measurement | 12.0V Series 0.0V～ 15.0V Measurement Accuracy±3%F.S. Resolution：Approx. 7.9mV 3.3V Series 0.0V～ 5.0V Measurement Accuracy±3%F.S. Resolution：Approx. 3.5mV Measurement Interval 125μsec～200msec Interval(125μsec step) Maximum 65520 sample |
|
| Drive Power Supply Current Measurement | 12.0V Series 0.0A～ 4.0A Measurement Accuracy±3%F.S Resolution：Approx. 2.0mA 3.3V Series 0.0A～ 5.0A Measurement Accuracy±3%F.S Resolution：Approx. 2.6mA Measurement Interval 125μsec～200msec Interval(125μsec step) Maximum 65520 sample |
|
| Control Unit | ||
| Name | SMART TESTER for PCIe G4 | |
| Outsides Dimensions WxDxH[mm] | 350x330x190 | |
| Weight | 6kg | |
| Drive Unit | ||
| Name | M.2-G4 Drive | EDSFF-G4 Drive |
| Types to be tested | Add-in Card(Standard) M.2(2230-22110) U.2(SFF8639) |
EDSFF |
| Durable Heat Temperature | Room Temperature～85℃ | Room Temperature～85℃ |
| Outsides Dimensions WxDxH[mm] | 290x340x340 | 300x500x290 |
| Weight | 9kg | 11kg |
| Adaptor for Drive under test | To be necessary later | To be necessary later |
※Specification may be changeable without a prior notice.
| System for PCIe Gen3 | |||
| Control Unit & Drive Unit | |||
| Number of Mountable Drives under Test | 4 pcs at maximum | ||
|---|---|---|---|
| Applicable Interface | Gen2 / Gen3 | ||
| Number of Lane | 4 lanes at maximum | ||
| Supported Protocols | NVMe 1.4 / NVMe 1.3 / AHCI | ||
| Supply Voltage to Drives | 12.0V Series Output Voltage：8.0V～14.5V 20mV Step Variable Voltage Accuracy：Preset Voltage±100mV Load Current：3.5Amax 3.3V Series Output Voltage：2.0V～ 4.0V 10mV Step Variable Voltage Accuracy: Preset Voltage± 50mV Load Current：4.2Amax |
||
| Drive Power Supply Voltage Measurement | 12.0V Series 0.0V～ 15.0V Measurement Accuracy±3%F.S. Resolution：Approx. 7.9mV 3.3V Series 0.0V～ 5.0V Measurement Accuracy±3%F.S. Resolution：Approx. 3.5mV Measurement Interval 125μsec～200msec Interval(125μsec Step) Maximum 65520 sample |
||
| Drive Power Supply Current Measurement | 12.0V Series 0.0A～ 4.0A Measurement Accuracy±3%F.S Resolution：Approx. 2.0mA 3.3V Series 0.0A～ 5.0A Measurement Accuracy±3%F.S Resolution：Approx. 2.6mA Measurement Interval 125μsec～200msec Interval(125μsec Step) Maximum 65520 sample |
||
| Control Unit | |||
| Name | SMART TESTER for PCIe G3 | ||
| Outside Dimensions WxDxH[mm] | 250x310x130 | ||
| Weight | 7kg | ||
| Drive Unit | |||
| Name | M.2-G3 Drive | Multi-Drive | EDSFF-G3 Drive |
| Types to be tested | M.2(2230-22110) | Add-in Card(Standard) M.2(2230-22110) U.2(SFF8639) |
EDSFF |
| Durable Heat Temperature | Room temperature～85℃ | Room temperature～85℃ | Room temperature～85℃ |
| Outsides Dimensions WxDxH[mm] | 400x160x60 | 250x230x160 | 300x500x290 |
| Weight | 3kg | 9kg | 11kg |
| Adaptor for Drive under test | Unnecessary | To be necessary later | To be necessary later |
※Specification may be changeable without a prior notice.
| System for SATA/SAS | |
| Control Unit & Drive Unit | |
| Number of Mountable Drives under Test | 4 pcs at maximum |
|---|---|
| Applicable Interface | SATA III, SAS II(Option), PATA(Option) |
| Supply Voltage to Drives | 5.0V Series Output Voltage：2.0V～ 6.0V 10mV Step Variable Voltage Accuracy: Preset Voltage±50mV 12.0V Series Output Voltage：8.0V～ 14.5V 10mV Step Variable Voltage Accuracy: Preset Voltage±100mV |
| Drive Power Supply Voltage Measurement | 5.0V Series 0.0V～ 15.0V Measurement Accuracy±1.5%F.S. Resolution：1mV 12.0V Series 0.0V～ 15.0V Measurement Accuracy±1.5%F.S. Resolution：1mV Measurement Interval 125μsec～200msec Interval(125μsec Step) Maximum 65520 sample |
| Drive Power Supply Current Measurement | 5.0V Series 0.0A～ 4.0A Measurement Accuracy±3%F.S Resolution：1mA 12.0V Series 0.0A～ 4.0A Measurement Accuracy±3%F.S Resolution：1mA Measurement Interval 125μsec～200msec Interval(125μsec Step) Maximum 65520 sample |
| Control Unit | |
| Name | SMART TESTER for 6G |
| Outsides Dimensions WxDxH[mm] | 259x258x58 |
| Weight | 3kg |
| Drive Unit | |
| Name | SATA/SAS Drive |
| Types to be tested | SSD 2.5inch type M.2(2230-22110) |
| Durable Heat Temperature | Room temperature～85℃ |
| Outsides Dimensions WxDxH[mm] | 150x200x60 |
| Weight | 6kg |
| Adaptor for Drive under test | Unnecessary |
※Specification may be changeable without a prior notice.