- Home
- Products/Services
- HDD/SSD Evaluation Equipment
- SMART TESTER for PCIe series
SMART TESTER
for PCIe series
SMART TESTER for PCIe is a tester which evaluates or analyze the functions and reliability of SSD.
<Support Interfaces>
- PCIe Gen4
- PCIe Gen3
<Support Protocols>
- NVMe 1.4
- NVMe 1.3
- AHCI
Application
Selection, Evaluation, Incoming Inspection and Failure Analysis of Storage Media
Product introduction video
HDD/SSD evaluation machine series
Overall
SMART TESTER Series
The Evaluation Testers which evaluate HDD/SSD(NVMe, SATA, SAS) are introduced.
HDD/SSD evaluation machine series
Overview
SMART TESTER Series
The accessibility of Read and Write of HDD/SSD, Reliability, Power, and Durability are introduced.
HDD/SSD evaluation machine series
Lineup & Functions
SMART TESTER Series
The Tester which can connect the EDSFF and M.2 SSD as well as the test software are introduced.
HDD/SSD evaluation machine series
Service business
SMART TESTER Series
The Data Copy, Data Erase, Screening, Failure Analysis, and Consulting Service of HDD/SSD are introduced.
Features
- Capable of flexible conduct of highly technical evaluation with the dedicated cooling-structure.
- Scripts which features the full countermeasures for SSD’s heat generation.
- Capable of easy-to-understand display of Drive’s performances by a graph.
- Capable of Drive’s power control / measurement. (Power shutdown, Varying Voltage)
- Capable of combinational proposal with Environment Test Chamber.
- Capable of conducting the global standard tests complying with SNIA SSS/PTS for Drive’s functions.
- Capable of consultation on Drive’s evaluation. (Please consult us because optional functions are also available.)
Main Functions
Capable of conducting a global standard benchmark test
Capable of conducting a global standard test specification with HIROTA’s original softwares
- TBW Test (for Enterprise & Client)
Evaluation of write endurance by JEDEC 218,219.- Endurance
- Data Retention
- Read Disturb
- SNIA SSS PTS (for Enterprise & Client)
Evaluate the marginal performance when the steady state is reached.
Vender Unique Access Test
- Basic Information Control
- SMART Data User Threshold Level Setup / Judgement
- Format(Protocol, Secure erase, Sanitize, Trim)
- Que Depth Control
- Writing Durability Evaluation
- Function Evaluation
- Degradation access Evaluation(Swing, Butterfly, Accordion)
Substantial Power Management
Evaluation is conducted under the intentionally hazardous environment such as noise, oscillation, etc.
The behavior of media is monitored by the graphs of measured data.
- The behavior of media is monitored by the graphs of measured data.
- Power Shut Down Evaluation (Data Retention)
- Electric Power Saving (Dev. Sleep, CLK Req) (Small amount of electricity continuation(μA) Function Support)
Displaying drive performances by a graph intelligibly
All test results are automatically logged and can be displayed in GUI mode such as graphs. This is optimal for long time data collection and benchmark test.
Drive Performance Benchmark Evaluation
It is accessible under the various kinds of conditions to measure the drive performance and IOPS.
This enables to compare a drive’s performance.
- Seqential Read
- Random Read
- Seqential Write
- Random Write
Current/Voltage Measurement and Variable Function
Drive’s current and voltage are measurable and the applied voltage is variable optionally.(10mV Step) They can be measured every 125μs sampling interval and the peak hold value can be accurately measured.
Operability Is Accepted By Various Users
Simple Test Mode Enables Easy-To-Understand Operation
The combinational function of Selectable method among multiple test conditions is originally equipped with.
Anyone can easily operate due to GUI function.
Sufficient Functions Are Accepted By Many Engineers
Combination of scripts enables customers to create their original test.
The tester is originally equipped with the various types of script debug function which creates their own test more smoothly .
Upon customer’s request, we are happy to assist your script creation.
Combination Proposal With Environment Test Chamber
SSD is affected by usage environment a lot and might cause a deterioration or malfunction.
It is important to select an optimal SSD in consideration of usage environment because it varies depending on a manufacturer or a model.
We can propose the various types of test like in which SSD is operated in temperature variation of the environment chamber.
Please feel free to contact us for more details.
Deployment to small burn-in test equipment for HDD/SSD
It can be deployed to a small burn-in test device (SSD compact burn-in test system) for SSD evaluation.
We propose to improve the reliability of SSD by performing evaluation while synchronizing with temperature.
We will provide various custom products, so please feel free to contact us.
- Temperature Control Range : from “Room temperature” to +85℃
- Space Temperature Deviation : ±2℃
- Number of Mountable SSDs under Test : 4 pcs at maximum
HDD/SSD compact burn-in Test System
Application to Mass production Type
It is applicable for a large equipment in use of mass production process.
We can provide with enhancement proposal of the drive’s reliability by the test in which we evaluate it under synchronized temperature and humidity.
<Burn-in Test Equipment>
- Temperature Control Range
At No Load : (Room Temperature+10℃) up to +65℃ - Temperature Accuracy At Steady State : within ±3℃
- Number of Connectable Drive : 192 ports / equipment(2.5inch)
<Constant Temperature and Humidity Testing Equipment>
- Temperature Control Range
At No Load : Temperature -35℃ ~ +90℃
Humidity 5%RH ~ 95%RH - Temperature Accuracy At Steady State : within ±3℃
- Number of Connectable Drive : 64 ports / equipment(2.5inch/3.5inch)
Model
Model No : H4PC-P4
Model No : H4PR-P3F4(Gen3) / H4PC-P4(Gen4)
Specifications
Model Type | H4PR-P3F4(Gen3) / H4PC-P4(Gen4) |
---|---|
Interface | PCIe Gen4 / PCIe Gen3 (4Lane) Support Protocol : NVMe 1.4, NVMe 1.3, AHCI |
Evaluation Device | Add-in Card(Standard) M.2(2230-22110) / U.2(SFF8639) Cfexpress Card |
Evaluation Port | 4port |
Input Power Supply | AC95~245V 50/60Hz |
Outer Dimensions | W370×D310×H530mm(Gen3) |
Specification may change without notice. A Personal Computer is not included in the system configuration.
Please contact us regarding the control performance and measurement resolution.